- Part Status :
- Supplier Device Package :
- اختيار مرشح :
14 المنتجات
| صور | نموذج | الأسعار | الكمية | جرد | صانع | وصف | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
عرض . |
1,958
بقعة
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
عرض . |
1,328
بقعة
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
عرض . |
3,459
بقعة
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||
|
|
عرض . |
848
بقعة
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||
|
|
عرض . |
3,954
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | ||
|
|
|
عرض . |
773
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
|
|
عرض . |
1,762
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
عرض . |
1,958
بقعة
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
عرض . |
1,328
بقعة
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
عرض . |
3,459
بقعة
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||
|
|
|
عرض . |
848
بقعة
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||
|
|
|
عرض . |
3,954
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | ||
|
|
|
عرض . |
773
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
عرض . |
1,762
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers |
1 / 1 صفحة .
