- Packaging :
- Operating Temperature :
10 المنتجات
صور | نموذج | الأسعار | الكمية | جرد | صانع | وصف | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
عرض . |
3,699
بقعة
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tube | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | |||
|
عرض . |
2,194
بقعة
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | |||
|
عرض . |
3,543
بقعة
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
|
عرض . |
3,690
بقعة
|
Texas Instruments | IC SCAN TEST DEV/TXRX 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
عرض . |
3,330
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
|
عرض . |
3,699
بقعة
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tube | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | |||
|
عرض . |
2,194
بقعة
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | |||
|
عرض . |
3,543
بقعة
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | |||
|
عرض . |
3,690
بقعة
|
Texas Instruments | IC SCAN TEST DEV/TXRX 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
|
عرض . |
3,330
بقعة
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers |
1 / 1 صفحة .