4 المنتجات
صور | نموذج | الأسعار | الكمية | جرد | صانع | وصف | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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عرض . |
2,710
بقعة
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Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
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عرض . |
1,147
بقعة
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
|
|
عرض . |
2,710
بقعة
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
|
|
عرض . |
1,147
بقعة
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers |
1 / 1 صفحة .